VISUALIZATION OF STRESS FIELDS IN MONOCRYSTALS BY THE JOINT APPLICATION OF X-RAY PENDELLOSUNG FRINGES AND MOIR PATTERNS METHODS
DOI:
https://doi.org/10.46991/PYSU:A/2005.39.1.136Keywords:
visualization of the isostrain lines, dislocation Si monocrystals, X-ray Moire and Pendellosung Fringes methodsAbstract
In the paper the results of visualization of the isostrain lines for local regions of dislocation Si monocrystals by joint application of X-ray Moire and Pendellosung Fringes methods are presented.
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2005-02-28
How to Cite
Aloumyan, K. V., & Eyramjyan, T. H. (2005). VISUALIZATION OF STRESS FIELDS IN MONOCRYSTALS BY THE JOINT APPLICATION OF X-RAY PENDELLOSUNG FRINGES AND MOIR PATTERNS METHODS. Proceedings of the YSU A: Physical and Mathematical Sciences, 39(1 (206), 136–138. https://doi.org/10.46991/PYSU:A/2005.39.1.136
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