IMAGING OF THE GRAIN STRUCTURE OF THIN HTS FILM BY A SINGLE-LAYER FLAT-COIL-OSCILLATOR TEST-METHOD (SFCO-TECHNIQUE)

Authors

  • S. G. Gevorgyan Chair of Solid State Physics, YSU, Institute Physical Researches, National Academy of Sciences, Armenia
  • H. G. Sharinyan Institute Physical Researches, National Academy of Sciences, Armenia
  • G. H. Karapetyan Chair of Solid State Physics, YSU, Institute Physical Researches, National Academy of Sciences, Armenia
  • G. S. Gevorgyan Chair of Solid State Physics, YSU, Armenia
  • A. A. Polyanskii National High Magnetic Field Laboratory, Florida State University, USA

DOI:

https://doi.org/10.46991/PYSU:A/2009.43.2.050

Keywords:

single-layer flat-coil-oscillator, SFCO, low temperature, laser scanning microscope, LTS, HTS, imaging

Abstract

An imaging technique has been created (using a focused He-Ne laser beam as a probing signal) capable of imaging the grain structure of HTS thin films with 2–3 μ spatial resolution. It is based on detection of an inductance change of a single-layer flat pick-up coil, placed at the face of the specimen. This leads to frequency changes of a stable tunnel diode oscillator. Test device enabled 2D-mapping of the grain structure of the bridge-shaped YBaCuO film. Basically, the method is capable of imaging fine peculiarities of normal-metallic to superconductive phase transition and 2D-current distribution, as well as may identify localized defects in thin HTS-materials with sub-μ spatial resolution, using non-bolometric response. However, the achieved 2–3 μ resolution of a bolometric nature (in a given device with ∼3 mm-size coil) is limited and depends on how narrow is possible to focus the probing beam, while the own spatial resolution of the tested flat-coil technique is better than 0.1 μ, and can be improved by 1–2 orders of the value by reducing pick-up coil size.

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Published

2009-06-26

How to Cite

Gevorgyan, S. G., Sharinyan, H. G., Karapetyan, G. H., Gevorgyan, G. S., & Polyanskii, A. A. (2009). IMAGING OF THE GRAIN STRUCTURE OF THIN HTS FILM BY A SINGLE-LAYER FLAT-COIL-OSCILLATOR TEST-METHOD (SFCO-TECHNIQUE). Proceedings of the YSU A: Physical and Mathematical Sciences, 43(2 (219), 50–54. https://doi.org/10.46991/PYSU:A/2009.43.2.050

Issue

Section

Physics